Narrow search
Showing 21 - 30 of 175
Cover Image
Development and Applications of a Three-Parameter Weibull Distribution with Load-Dependent Location and Scale Parameters
Sun, Y.S.; Xie, M.; Goh, T.N.; Ong, H.L. - In: Reliability engineering & system safety 40 (1993) 2, pp. 133-138
Persistent link: https://www.econbiz.de/10006869496
Cover Image
A two-stage decision procedure for monitoring processes with low fraction nonconforming
Chan, L.Y.; Lai, C.D.; Xie, M.; Goh, T.N. - In: European journal of operational research : EJOR 150 (2003) 2, pp. 420-436
Persistent link: https://www.econbiz.de/10006650595
Cover Image
A control chart for the Gamma distribution as a model of time between events
Zhang, C.W.; Xie, M.; Liu, J.Y.; Goh, T.N. - In: International journal of production research : American … 45 (2007) 23, pp. 5649
Persistent link: https://www.econbiz.de/10007864087
Cover Image
A quality monitoring and decision-making scheme for automated production processes
Xie, M.; Lu, X.S.; Goh, T.N.; Chan, L.Y. - In: International journal of quality & reliability management 16 (1999) 2, pp. 148-157
Persistent link: https://www.econbiz.de/10006390410
Cover Image
A Comparative Study of CCC and CUSUM Charts
Xie, M.; Goh, T.N.; Lu, X.S. - In: Quality and reliability engineering international 14 (1998) 5, pp. 339-346
Persistent link: https://www.econbiz.de/10006391740
Cover Image
The use of probability limits for process control based on geometric distribution
Xie, M.; Goh, T.N. - In: International journal of quality & reliability management 14 (1997) 1, pp. 64-73
Persistent link: https://www.econbiz.de/10006397138
Cover Image
Control Charts for Processes Subject to Random Shocks
Xie, W.; Xie, M.; Goh, T.N. - In: Quality and reliability engineering international 11 (1995) 5, pp. 355-360
Persistent link: https://www.econbiz.de/10006404383
Cover Image
A Shewart-like Charting Technique for High Yield Processes
Xie, W.; Xie, M.; Goh, T.N. - In: Quality and reliability engineering international 11 (1995) 3, pp. 189-196
Persistent link: https://www.econbiz.de/10006404894
Cover Image
SPC of a Near Zero-defect Process Subject to Random Shocks:
Xie, M.; Goh, T.N. - In: Quality and reliability engineering international 9 (1993) 2, pp. 89-94
Persistent link: https://www.econbiz.de/10006413461
Cover Image
Improvement Detection by Control Charts for High Yield Processes
Xie, M.; Goh, T.N. - In: International journal of quality & reliability management 10 (1993) 7, pp. 24-31
Persistent link: https://www.econbiz.de/10006413494