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On the distribution of the estimated process yield index Spk
Lee, J.C.; Hung, H.N.; Pearn, W.L.; Kueng, T.L. - In: Quality and reliability engineering international 18 (2002) 2, pp. 111-116
Persistent link: https://www.econbiz.de/10006375174
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On the reliability of the estimated incapability index
Pearn, W.L.; Lin, G.H. - In: Quality and reliability engineering international 17 (2001) 4, pp. 279-290
Persistent link: https://www.econbiz.de/10006378459
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Number 5 - A generalization of Clements' method for non-normal Pearsonian processes with asymmetric tolerances
Pearn, W.L.; Chen, K.S.; Lin, G.H. - In: International journal of quality & reliability management 16 (1999) 4-5, pp. 507-521
Persistent link: https://www.econbiz.de/10006387328
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REGULAR PAPERS - Making Decisions in Assessing Process Capability Index Cpk
Pearn, W.L.; Chen, K.S. - In: Quality and reliability engineering international 15 (1999) 4, pp. 321-326
Persistent link: https://www.econbiz.de/10006389286
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An Application of Non-Normal Process Capability Indices
Chen, K.S.; Pearn, W.L. - In: Quality and reliability engineering international 13 (1997) 6, pp. 355-360
Persistent link: https://www.econbiz.de/10006394426
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Capability Testing Based on Cpm with Multiple Samples
Wu, Chien-Wei; Pearn, W.L. - In: Quality and reliability engineering international 21 (2005) 1, pp. 29-42
Persistent link: https://www.econbiz.de/10006360260
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A Bayesian Approach to Obtain a Lower Bound for the Cpm Capability Index
Lin, G.H.; Pearn, W.L.; Yang, Y.S. - In: Quality and reliability engineering international 21 (2005) 6, pp. 655
Persistent link: https://www.econbiz.de/10006361597
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Accuracy Analysis of the Estimated Process Yield Based on Spk
Pearn, W.L.; Chuang, C.C. - In: Quality and reliability engineering international 20 (2004) 4, pp. 305-316
Persistent link: https://www.econbiz.de/10006365975
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Capability measures for processes with multiple characteristics
Chen, K.S.; Pearn, W.L.; Lin, P.C. - In: Quality and reliability engineering international 19 (2003) 2, pp. 101-110
Persistent link: https://www.econbiz.de/10006369921
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A case study on the multistage IC final testing scheduling problem with reentry
Pearn, W.L.; Chung, S.H.; Chen, A.Y.; Yang, M.H. - In: International journal of production economics 88 (2004) 3, pp. 257-268
Persistent link: https://www.econbiz.de/10006248339