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Control wafers inventory management in the wafer fabrication photolithography area
Chung, S.-H.; Pearn, W.L.; Kang, H.-Y. - In: Production planning & control : PPC 16 (2005) 3, pp. 286-296
Persistent link: https://www.econbiz.de/10007149657
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A case study on the wafer probing scheduling problem
Pearn, W.L.; Chung, S.H.; Yang, M.H. - In: Production planning & control : PPC 13 (2002) 1, pp. 66-75
Persistent link: https://www.econbiz.de/10007169019
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Measuring Production Performance of Different Product Mixes in Semiconductor Fabrication
Chung, S.-H.; Pearn, W.L.; Lee, A.H.I. - In: International journal of industrial engineering : … 13 (2006) 1, pp. 5-17
Persistent link: https://www.econbiz.de/10007268017
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Tool replacement for production with a low fraction of defectives
Pearn, W.L.; Hsu, Ya-Chen; Wu, Chien-Wei - In: International journal of production research : American … 44 (2006) 12, pp. 2313-2326
Persistent link: https://www.econbiz.de/10007223527
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Solution strategies for multi-stage wafer probing scheduling problem with reentry
Pearn, W.L.; Chung, S.H.; Yang, M.H.; Shiao, K.P. - In: Journal of the Operational Research Society : OR 59 (2008) 5, pp. 637-651
Persistent link: https://www.econbiz.de/10007993337
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Capability adjustment for gamma processes with mean shift consideration in implementing Six Sigma program
Hsu, Ya-Chen; Pearn, W.L.; Wu, Pei-Ching - In: European journal of operational research : EJOR 191 (2008) 2, pp. 516-528
Persistent link: https://www.econbiz.de/10008057676
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On the Maximum Benefit Chinese Postman Problem
Pearn, W.L.; Wang, K.H. - In: Omega : the international journal of management science 31 (2003) 4, pp. 269-274
Persistent link: https://www.econbiz.de/10006762032
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An overview of theory and practice on process capability indices for quality assurance
Wu, Chien-Wei; Pearn, W.L.; Kotz, Samuel - In: International journal of production economics 117 (2009) 2, pp. 338-360
Persistent link: https://www.econbiz.de/10008895243
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The burn-in test scheduling problem with batch dependent processing time and sequence dependent setup time
Pearn, W.L.; Hong, J.S.; Tai, Y.T. - In: International journal of production research : American … 51 (2013) 6, pp. 1694-1706
Persistent link: https://www.econbiz.de/10010054363
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A variables sampling plan based on Cpmk for product acceptance determination
Wu, Chien-Wei; Pearn, W.L. - In: European Journal of Operational Research 184 (2008) 2, pp. 549-560
Persistent link: https://www.econbiz.de/10005095094