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Study of traffic flow at an unsignalized T-shaped intersection by cellular automata model

Wu, Q.-S.; Li, X.-B.; Hu, M.-B.; Jiang, R. - In: The European Physical Journal B - Condensed Matter and … 48 (2005) 2, pp. 265-269

In this paper, the traffic flow at an unsignalized T-shaped intersection in which there are three input directions of vehicles and two right-turnings and one left-turning has been investigated by using the cellular automata traffic model. The interactions between vehicles on different lanes and...

Persistent link: https://www.econbiz.de/10009282599

Comments on: a new aggregation method in a fuzzy environment

Jiang, R.; Ji, P.; Lee, W.B. - In: Decision support systems : DSS ; the international journal 35 (2003) 3, pp. 435

Persistent link: https://www.econbiz.de/10006171057

Two optimization models of the optimum inspection problem

Jiang, R.; Jardine, A.K.S. - In: Journal of the Operational Research Society : OR 56 (2005) 10, pp. 1176-1183

Persistent link: https://www.econbiz.de/10006014828

Scale transitivity in the AHP

Ji, P.; Jiang, R. - In: Journal of the Operational Research Society : OR 54 (2003) 8, pp. 896-905

Persistent link: https://www.econbiz.de/10006026153

DISTRIBUTIONS -- PROBABILITY AND STATISTICAL-INFERENCE - The exponentiated Weibull family: A graphical approach

Jiang, R.; Murthy, D. - In: IEEE transactions on reliability : R ; IEEE T R 48 (1999) 1, pp. 68-72

Persistent link: https://www.econbiz.de/10006627099

SYSTEM RELIABILITY -- MEASURES, PREDICTION, OPTIMIZATION, ESTIMATION - Approaches for reliability modeling of continuous-state devices

Zuo, M.; Jiang, R.; Yam, R. - In: IEEE transactions on reliability : R ; IEEE T R 48 (1999) 1, pp. 9-18

Persistent link: https://www.econbiz.de/10006627106

Comment on: A general linear-regression analysis applied to the 3-parameter Weibull distribution

Jiang, R.; Murthy, D. - In: IEEE transactions on reliability : R ; IEEE T R 46 (1997) 3, pp. 389-392

Persistent link: https://www.econbiz.de/10006629870

Modeling failure-data by a mixture of two Weibull distributions: A graphical approach

Jiang, R.; Murthy, D. - In: IEEE transactions on reliability : R ; IEEE T R 44 (1995) 3, pp. 477-487

Persistent link: https://www.econbiz.de/10006633948

n-fold Weibull multiplicative model

Jiang, R.; Murthy, D.N.P.; Ji, P. - In: Reliability engineering & system safety 74 (2001) 2, pp. 211-220

Persistent link: https://www.econbiz.de/10006830665

Models involving two inverse Weibull distributions

Jiang, R.; Murthy, D.N.P.; Ji, P. - In: Reliability engineering & system safety 73 (2001) 1, pp. 73-82

Persistent link: https://www.econbiz.de/10006832658