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Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of defectives
Pearn, W.L.; Wu, Chien-Wei - In: Omega : the international journal of management science 34 (2006) 1, pp. 90-101
Persistent link: https://www.econbiz.de/10006748632
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DISTRIBUTIONAL PROPERTIES AND IMPLICATIONS OF THE ESTIMATED PROCESS INCAPABILITY INDEX Cnpp
Lin, P.C.; Pearn, W.L.; Chen, K.S. - In: American journal of mathematical and management sciences 23 (2003) 1-2, pp. 75-92
Persistent link: https://www.econbiz.de/10006820681
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Capability Testing Based on Cpm with Multiple Samples
Wu, Chien-Wei; Pearn, W.L. - In: Quality and reliability engineering international 21 (2005) 1, pp. 29-42
Persistent link: https://www.econbiz.de/10006360260
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A Bayesian Approach to Obtain a Lower Bound for the Cpm Capability Index
Lin, G.H.; Pearn, W.L.; Yang, Y.S. - In: Quality and reliability engineering international 21 (2005) 6, pp. 655
Persistent link: https://www.econbiz.de/10006361597
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Accuracy Analysis of the Estimated Process Yield Based on Spk
Pearn, W.L.; Chuang, C.C. - In: Quality and reliability engineering international 20 (2004) 4, pp. 305-316
Persistent link: https://www.econbiz.de/10006365975
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Capability measures for processes with multiple characteristics
Chen, K.S.; Pearn, W.L.; Lin, P.C. - In: Quality and reliability engineering international 19 (2003) 2, pp. 101-110
Persistent link: https://www.econbiz.de/10006369921
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One-sided capability indices CPU and CPL: decision making with sample information
Pearn, W.L.; Chen, K.S. - In: International journal of quality & reliability management 19 (2002) 3, pp. 221-245
Persistent link: https://www.econbiz.de/10006372142
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Computer program for calculating the p-value in testing process capability index Cpmk
Pearn, W.L.; Lin, P.C. - In: Quality and reliability engineering international 18 (2002) 4, pp. 333-342
Persistent link: https://www.econbiz.de/10006374086
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Estimated incapability index: Reliability and decision making with sample information
Pearn, W.L.; Lin, G.H. - In: Quality and reliability engineering international 18 (2002) 2, pp. 141-148
Persistent link: https://www.econbiz.de/10006375171
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On the distribution of the estimated process yield index Spk
Lee, J.C.; Hung, H.N.; Pearn, W.L.; Kueng, T.L. - In: Quality and reliability engineering international 18 (2002) 2, pp. 111-116
Persistent link: https://www.econbiz.de/10006375174