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Capability Testing Based on Cpm with Multiple Samples
Wu, Chien-Wei; Pearn, W.L. - In: Quality and reliability engineering international 21 (2005) 1, pp. 29-42
Persistent link: https://www.econbiz.de/10006360260
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A Bayesian Approach to Obtain a Lower Bound for the Cpm Capability Index
Lin, G.H.; Pearn, W.L.; Yang, Y.S. - In: Quality and reliability engineering international 21 (2005) 6, pp. 655
Persistent link: https://www.econbiz.de/10006361597
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Accuracy Analysis of the Estimated Process Yield Based on Spk
Pearn, W.L.; Chuang, C.C. - In: Quality and reliability engineering international 20 (2004) 4, pp. 305-316
Persistent link: https://www.econbiz.de/10006365975
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Capability measures for processes with multiple characteristics
Chen, K.S.; Pearn, W.L.; Lin, P.C. - In: Quality and reliability engineering international 19 (2003) 2, pp. 101-110
Persistent link: https://www.econbiz.de/10006369921
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A case study on the multistage IC final testing scheduling problem with reentry
Pearn, W.L.; Chung, S.H.; Chen, A.Y.; Yang, M.H. - In: International journal of production economics 88 (2004) 3, pp. 257-268
Persistent link: https://www.econbiz.de/10006248339
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Control wafers inventory management in the wafer fabrication photolithography area
Chung, S.-H.; Pearn, W.L.; Kang, H.-Y. - In: Production planning & control : PPC 16 (2005) 3, pp. 286-296
Persistent link: https://www.econbiz.de/10007149657
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A case study on the wafer probing scheduling problem
Pearn, W.L.; Chung, S.H.; Yang, M.H. - In: Production planning & control : PPC 13 (2002) 1, pp. 66-75
Persistent link: https://www.econbiz.de/10007169019
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Measuring Production Performance of Different Product Mixes in Semiconductor Fabrication
Chung, S.-H.; Pearn, W.L.; Lee, A.H.I. - In: International journal of industrial engineering : … 13 (2006) 1, pp. 5-17
Persistent link: https://www.econbiz.de/10007268017
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Solution strategies for multi-stage wafer probing scheduling problem with reentry
Pearn, W.L.; Chung, S.H.; Yang, M.H.; Shiao, K.P. - In: Journal of the Operational Research Society : OR 59 (2008) 5, pp. 637-651
Persistent link: https://www.econbiz.de/10007993337
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On the Maximum Benefit Chinese Postman Problem
Pearn, W.L.; Wang, K.H. - In: Omega : the international journal of management science 31 (2003) 4, pp. 269-274
Persistent link: https://www.econbiz.de/10006762032