Narrow search
Showing 1 - 7 of 7
Cover Image
Reliability Demonstration Through Degradation Bogey Testing
Yang, S; Wu, J; Pecht, M G - In: IEEE transactions on reliability : R ; IEEE T R 58 (2009) 4, pp. 604-611
Persistent link: https://www.econbiz.de/10008372281
Cover Image
Bayesian Analysis of Pareto Reliability With Dependent Masked Data
Yang, S; Wu, J; Pecht, M G - In: IEEE transactions on reliability : R ; IEEE T R 58 (2009) 4, pp. 583-589
Persistent link: https://www.econbiz.de/10008340975
Cover Image
Benefits and Challenges of System Prognostics
Sun, B; Zeng, S; Kang, R; Pecht, M G - In: IEEE transactions on reliability : R ; IEEE T R 61 (2012) 2, pp. 323-336
Persistent link: https://www.econbiz.de/10009985656
Cover Image
Online Anomaly Detection for Hard Disk Drives Based on Mahalanobis Distance
Wang, Y; Miao, Q; Ma, E W M; Tsui, K-L; Pecht, M G - In: IEEE transactions on reliability : R ; IEEE T R 62 (2013) 1, pp. 136-145
Persistent link: https://www.econbiz.de/10010093492
Cover Image
Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process
Si, X-S; Wang, W; Hu, C-H; Zhou, D-H; Pecht, M G - In: IEEE transactions on reliability : R ; IEEE T R 61 (2012) 1, pp. 50-68
Persistent link: https://www.econbiz.de/10009844385
Cover Image
Electrostatic Monitoring of Gas Path Debris for Aero-engines
Wen, Z; Zuo, H; Pecht, M G - In: IEEE transactions on reliability : R ; IEEE T R 60 (2011) 1, pp. 33-41
Persistent link: https://www.econbiz.de/10008885982
Cover Image
An Options Approach for Decision Support of Systems With Prognostic Capabilities
Haddad, G; Sandborn, P A; Pecht, M G - In: IEEE transactions on reliability : R ; IEEE T R 61 (2012) 4, pp. 872-883
Persistent link: https://www.econbiz.de/10010056620