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Statistical testing for assessing the performance of lifetime index of electronic components with exponential distribution
Tong, Lee-Ing; Chen, K.S.; Chen, H.T. - In: International journal of quality & reliability management 19 (2002) 7, pp. 812-824
Persistent link: https://www.econbiz.de/10006373837
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Number 6 - Average type-II censoring time for two-parameter Pareto and Rayleigh distributions
Chiou, Kuo-Ching; Tong, Lee-Ing - In: International journal of quality & reliability management 18 (2001) 6-7, pp. 643-656
Persistent link: https://www.econbiz.de/10006378820
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Lower confidence limits of process capability indices for non-normal process distributions
Tong, Lee-Ing; Chen, Jann-Pygn - In: International journal of quality & reliability management 15 (1998) 8-9, pp. 907-919
Persistent link: https://www.econbiz.de/10006391798
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Modified process control chart in IC fabrication using clustering analysis
Tong, Lee-Ing - In: International journal of quality & reliability management 15 (1998) 6-7, pp. 582-598
Persistent link: https://www.econbiz.de/10006392240
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A non-parametric method for experimental analysis with censored data
Tong, Lee-Ing; Su, Chao-Ton - In: International journal of quality & reliability management 14 (1997) 4-5, pp. 456-463
Persistent link: https://www.econbiz.de/10006396010
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The optimization of multi-response problems in the Taguchi method
Tong, Lee-Ing; Su, Chao-Ton; Wang, Chung-Ho - In: International journal of quality & reliability management 14 (1997) 4-5, pp. 367-380
Persistent link: https://www.econbiz.de/10006396018
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Forecasting field failure data for repairable systems using neural networks and SARIMA model
Tong, Lee-Ing; Liang, Yi-Hui - In: International journal of quality & reliability management 22 (2005) 4, pp. 410-420
Persistent link: https://www.econbiz.de/10006362986
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Multi-response robust design by principal component analysis
Su, Chao-Ton; Tong, Lee-Ing - In: Total quality management 8 (1997) 6, pp. 409-416
Persistent link: https://www.econbiz.de/10007195542
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An innovative model of multi-project wafer service in the foundry industry
Yang, Tai-Yih; Tong, Lee-Ing; Yuan, Benjamin J.C. - In: International journal of technology management : IJTM 30 (2005) 1-2, pp. 172-187
Persistent link: https://www.econbiz.de/10006960011
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Robust design for multiple dynamic quality characteristics using data envelopment analysis
Tong, Lee-Ing; Wang, Chung-Ho; Tsai, Chih-Wei - In: Quality and reliability engineering international 24 (2008) 5, pp. 557-572
Persistent link: https://www.econbiz.de/10008085282