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An Application of Non-Normal Process Capability Indices
Chen, K.S.; Pearn, W.L. - In: Quality and reliability engineering international 13 (1997) 6, pp. 355-360
Persistent link: https://www.econbiz.de/10006394426
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Capability Testing Based on Cpm with Multiple Samples
Wu, Chien-Wei; Pearn, W.L. - In: Quality and reliability engineering international 21 (2005) 1, pp. 29-42
Persistent link: https://www.econbiz.de/10006360260
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A Bayesian Approach to Obtain a Lower Bound for the Cpm Capability Index
Lin, G.H.; Pearn, W.L.; Yang, Y.S. - In: Quality and reliability engineering international 21 (2005) 6, pp. 655
Persistent link: https://www.econbiz.de/10006361597
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Accuracy Analysis of the Estimated Process Yield Based on Spk
Pearn, W.L.; Chuang, C.C. - In: Quality and reliability engineering international 20 (2004) 4, pp. 305-316
Persistent link: https://www.econbiz.de/10006365975
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Capability measures for processes with multiple characteristics
Chen, K.S.; Pearn, W.L.; Lin, P.C. - In: Quality and reliability engineering international 19 (2003) 2, pp. 101-110
Persistent link: https://www.econbiz.de/10006369921
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A case study on the multistage IC final testing scheduling problem with reentry
Pearn, W.L.; Chung, S.H.; Chen, A.Y.; Yang, M.H. - In: International journal of production economics 88 (2004) 3, pp. 257-268
Persistent link: https://www.econbiz.de/10006248339
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Control wafers inventory management in the wafer fabrication photolithography area
Chung, S.-H.; Pearn, W.L.; Kang, H.-Y. - In: Production planning & control : PPC 16 (2005) 3, pp. 286-296
Persistent link: https://www.econbiz.de/10007149657
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A case study on the wafer probing scheduling problem
Pearn, W.L.; Chung, S.H.; Yang, M.H. - In: Production planning & control : PPC 13 (2002) 1, pp. 66-75
Persistent link: https://www.econbiz.de/10007169019
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Measuring Production Performance of Different Product Mixes in Semiconductor Fabrication
Chung, S.-H.; Pearn, W.L.; Lee, A.H.I. - In: International journal of industrial engineering : … 13 (2006) 1, pp. 5-17
Persistent link: https://www.econbiz.de/10007268017
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Tool replacement for production with a low fraction of defectives
Pearn, W.L.; Hsu, Ya-Chen; Wu, Chien-Wei - In: International journal of production research : American … 44 (2006) 12, pp. 2313-2326
Persistent link: https://www.econbiz.de/10007223527