Chen, Z.; Sepúlveda, A.; Ediger, M.; Richert, R. - In: The European Physical Journal B - Condensed Matter and … 85 (2012) 8, pp. 1-5
We report a new approach to measuring the dielectric behavior of thin films by means of differential interdigitated electrode (IDE) cells coupled with a dual-channel impedance measurement setup. The differential IDE cell consists of two identical IDE’s on a common substrate. With one IDE...