Kenyon, George N; Sale, R. Samual; Hozak, Kurt; Chiou, Paul - In: International Journal of Quality & Reliability Management 33 (2016) 7, pp. 882-899
Purpose – The purpose of this paper is to develop an yield-based process capability index (PCI), C py , to overcome the shortcomings of existing PCIs that limit their use and lead to inaccurate measures of quality conformance under a variety of common conditions. Design/methodology/approach...