Similar Search Results

Process Capability Evaluation for the Process of Product Families

Chen, K.; Huang, M. - In: Quality & Quantity: International Journal of Methodology 41 (2007) 1, pp. 151-162

Persistent link: https://www.econbiz.de/10009396234

Development of the yield-based process capability index, Cpy, to flexibly and accurately measure conformance

Kenyon, George N.; Sale, R. Samual; Hozak, Kurt; Chiou, Paul - In: International journal of quality & reliability management 33 (2016) 7, pp. 882-899

Persistent link: https://www.econbiz.de/10011603959

Development of the yield-based process capability index, C py , to flexibly and accurately measure conformance

Kenyon, George N; Sale, R. Samual; Hozak, Kurt; Chiou, Paul - In: International Journal of Quality & Reliability Management 33 (2016) 7, pp. 882-899

Purpose – The purpose of this paper is to develop an yield-based process capability index (PCI), C py , to overcome the shortcomings of existing PCIs that limit their use and lead to inaccurate measures of quality conformance under a variety of common conditions. Design/methodology/approach...

Persistent link: https://www.econbiz.de/10014801460

Efficient methods for comparing two process yields : strategies on supplier selection

Wu, Chien-wei; Liao, Mou-yuan; Yang, Tsung-tse - In: International journal of production research 51 (2013) 5, pp. 1587-1602

Persistent link: https://www.econbiz.de/10009705713

Univariate and multivariate process yield indices based on location-scale family of distributions

Dharmasena, L. S.; Zeephongsekul, Panlop - In: International journal of production research 52 (2014) 11, pp. 3348-3365

Persistent link: https://www.econbiz.de/10010357013

An improved approach for process performance evaluation with the consideration of process yield and quality loss

Wu, Chien-wei; Lin, Chi-wei; Chen, James C. - In: International journal of production research 51 (2013) 21, pp. 6397-6409

Persistent link: https://www.econbiz.de/10010228988

A new process capability index for multiple quality characteristics based on principal components

Dharmasena, L. S.; Zeephongsekul, Panlop - In: International journal of production research 54 (2016) 15/16, pp. 4617-4633

Persistent link: https://www.econbiz.de/10011518916

Multiple comparisons with the best for supplier selection with linear profiles

Wang, Fu-Kwun; Tamirat, Yeneneh - In: International journal of production research 54 (2016) 5/6, pp. 1388-1397

Persistent link: https://www.econbiz.de/10011495244

Designing a yield-based skip-lot sampling plan for lot acceptance determination

Wu, Chien-wei; Chen, Jr-Tzung; Liu, Shih-Wen - In: Journal of the Operational Research Society 73 (2022) 3, pp. 653-663

Persistent link: https://www.econbiz.de/10013170170

A variable-type skip-lot sampling plan for products with a unilateral specification limit

Wu, Chien-wei; Lee, Amy H. I.; Huang, Yi-San - In: International journal of production research 59 (2021) 14, pp. 4140-4156

Persistent link: https://www.econbiz.de/10012589275