Zhang, Shangli; Qin, Hong - In: Statistics & Probability Letters 76 (2006) 6, pp. 634-640
Based on a so-called uniformity pattern, Fang and Qin [2005. Uniformity pattern and related criteria for two-level factorials. Sci. China Ser. A 48, 1-11] proposed the minimum projection uniformity criterion to assess and compare two-level factorials. In present paper, we study applications of...