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Expectation Maximization Algorithm for One Shot Device Accelerated Life Testing with Weibull Lifetimes, and Variable Parameters over Stress

Balakrishnan, N; Ling, M H - In: IEEE transactions on reliability : R ; IEEE T R 62 (2013) 2, pp. 537-536

Persistent link: https://www.econbiz.de/10010136967

EM-Based Likelihood Inference for Some Lifetime Distributions Based on Left Truncated and Right Censored Data and Associated Model Discrimination

Balakrishnan, N - 2014

Data arising from life-testing and reliability studies are often left truncated and right censored. Some of the most commonly used distributions to model lifetime data are the lognormal, Weibull, gamma and exponential distributions. Here, the EM algorithm is used to estimate the parameters of...

Persistent link: https://www.econbiz.de/10013043990

Testing - Comparison of the Mean Time Between Failures for Two Systems Under Short Tests

Tseng, S-T; Balakrishnan, N; Tsai, C-C - In: IEEE transactions on reliability : R ; IEEE T R 58 (2009) 4, pp. 589-597

Persistent link: https://www.econbiz.de/10008372283

Progressive-Stress Accelerated Degradation Test for Highly-Reliable Products

Nanda, A K; Bhattacharjee, S; Balakrishnan, N - In: IEEE transactions on reliability : R ; IEEE T R 59 (2010) 1, pp. 30-38

Persistent link: https://www.econbiz.de/10008395382

Minimum-Distance Parametric Estimation Under Progressive Type-I Censoring

Balakrishnan, N; Bordes, L; Zhao, X - In: IEEE transactions on reliability : R ; IEEE T R 59 (2010) 2, pp. 413-426

Persistent link: https://www.econbiz.de/10008432102

Optimal Design for Degradation Tests Based on Gamma Processes With Random Effects

Tsai, C-C; Tseng, S-T; Balakrishnan, N - In: IEEE transactions on reliability : R ; IEEE T R 61 (2012) 2, pp. 604-604

Persistent link: https://www.econbiz.de/10009985681

Special Invited Papers in Reliability and Risk - A Meta-Analysis of Multisample Type-II Censored Data With Parametric and Nonparametric Results

Balakrishnan, N; Volterman, W; Zhang, L - In: IEEE transactions on reliability : R ; IEEE T R 62 (2013) 1, pp. 2-12

Persistent link: https://www.econbiz.de/10010093480

Lifetime Data Analysis - Likelihood Inference Based on Left Truncated and Right Censored Data From a Gamma Distribution

Balakrishnan, N; Mitra, D - In: IEEE transactions on reliability : R ; IEEE T R 62 (2013) 3, pp. 679-688

Persistent link: https://www.econbiz.de/10010180875

A Proposed Measure of Residual Life of Live Components of a Coherent System

Balakrishnan, N; Asadi, M - In: IEEE transactions on reliability : R ; IEEE T R 61 (2012) 1, pp. 41-50

Persistent link: https://www.econbiz.de/10009844384

A General Purpose Approximate Goodness-of-Fit Test for Progressively Type-II Censored Data

Pakyari, R; Balakrishnan, N - In: IEEE transactions on reliability : R ; IEEE T R 61 (2012) 1, pp. 238-245

Persistent link: https://www.econbiz.de/10009844405