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A variables sampling plan based on Cpmk for product acceptance determination
Wu, Chien-wei; Pearn, W. L. - In: European journal of operational research : EJOR 184 (2008) 2, pp. 549-560
Persistent link: https://www.econbiz.de/10003768287
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Sample size determination for production yield estimation with multiple independent process characteristics
Hsu, Ya-chen; Pearn, W. L.; Chuang, Ya-Fei - In: European journal of operational research : EJOR 196 (2009) 3, pp. 968-978
Persistent link: https://www.econbiz.de/10003825074
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Select better suppliers based on manufacturing precision for processes with multivariate data
Yen, C. H.; Pearn, W. L. - In: International journal of production research 47 (2009) 11, pp. 2961-2974
Persistent link: https://www.econbiz.de/10003889584
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Minimising makespan on parallel batch processing machines with non-identical ready time and arbitrary job sizes
Chung, Sai Ho; Tai, Y. T.; Pearn, Wen-lea - In: International journal of production research 47 (2009) 18, pp. 5109-5128
Persistent link: https://www.econbiz.de/10003891275
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Fast and effective algorithms for the liquid crystal display module (LCM) scheduling problem with sequence-dependent setup time
Chung, Sai Ho; Pearn, Wen-lea; Tai, Y. T. - In: Journal of the Operational Research Society : OR 60 (2009) 7, pp. 921-933
Persistent link: https://www.econbiz.de/10003869809
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Procedure of the convolution method for estimating production yield with sample size information
Pearn, W. L.; Hung, Hui Nien; Cheng, Ya Ching; Lin, Gu Hong - In: International journal of production research 48 (2010) 5/6, pp. 1245-1265
Persistent link: https://www.econbiz.de/10003939392
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Measuring production yield for processes with multiple characteristics
Pearn, W. L.; Cheng, Ya Ching - In: International journal of production research 48 (2010) 15/16, pp. 4519-4536
Persistent link: https://www.econbiz.de/10003994069
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Cycle time estimation for semiconductor final testing processes with Weibull-distributed weiting time
Tai, Y. T.; Pearn, Wen-lea; Lee, J. H. - In: International journal of production research 50 (2012) 2, pp. 581-592
Persistent link: https://www.econbiz.de/10009549619
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Production yield measure for multiple characteristics processes based on SpkT under mutlitple samples
Pearn, W. L.; Yen, Ching-Ho; Yang, Dong-Yuh - In: Central European journal of operations research : CEJOR … 20 (2012) 1, pp. 65-85
Persistent link: https://www.econbiz.de/10009490698
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Assessing the actual Gamma process quality : a curve-fitting approach for modifying the non-normal flexible index
Liao, Mou-yuan; Pearn, Wen-lea; Liu, Yen-lun - In: International journal of production research 53 (2015) 15, pp. 4720-4734
Persistent link: https://www.econbiz.de/10011344637