In the one- and multi-sample cases, in the context of life-testing reliability experiments, we introduce minimal repair processes under a simple step-stress test, based on exponential distributions and an associated cumulative exposure model, and then develop likelihood inference for such a model.

Optimal censoring schemes in the model of progressive type II censoring are obtained for a location-scale family of distributions which includes exponential, uniform and Pareto distributions. In the one-parameter set-up the variance of the respective BLUE is used as an optimality criterion. In...