ZHAO, PEI; WANG, RENG; LIU, DINGQUAN; ZHANG, FENGSHAN; … - In: Surface Review and Letters (SRL) 15 (2008) 06, pp. 787-791
The effects of the roughness of ZnS underlayer on the microstructure, optical, and electrical properties of nanometer … topography and the roughness of ZnS underlayer have been analyzed by atomic force microscopy. The sheet resistant will become … larger as the increasing of the roughness. The optical constants can be derived by fitting the transmission and reflectance …