Ortiz-Cruz, A.; Santolalla, C.; Moreno, E.; de los … - In: Physica A: Statistical Mechanics and its Applications 391 (2012) 4, pp. 1642-1651
X-ray diffraction (XRD) patterns with broad background are commonly found in the characterization of materials with a certain degree of amorphicity, so the sharp intensity peaks associated with material phases are not well defined. This work used rescaled range (denoted by R/S) analysis, a...