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A new approach to financial integration and market income inequality

Inekwe, John Nkwoma; Jin, Yi; Valenzuela, Maria Rebecca J. - In: Emerging markets review 37 (2018), pp. 134-147

Persistent link: https://www.econbiz.de/10012114994

Financial conditions and economic growth

Inekwe, John Nkwoma; Jin, Yi; Valenzuela, Maria Rebecca J. - In: International review of economics & finance : IREF 61 (2019), pp. 128-140

Persistent link: https://www.econbiz.de/10012205390

Global financial network and liquidity risk

Inekwe, John Nkwoma; Jin, Yi; Valenzuela, Maria Rebecca J. - In: Australian journal of management 43 (2018) 4, pp. 593-613

Persistent link: https://www.econbiz.de/10011976007

On the Local Interaction of Money and Credit

Jin, Y.; Temzelides, T. - EconWPA - 1999

We study the emergence and coexistence of monetary and credit transactions in a model where exchange is decentralized. Agents belong to different villages which are informationally separated. The frequency of meetings between any two different villages decreases as their respective geographic...

Persistent link: https://www.econbiz.de/10005076754

Modeling and Analyzing Cultural Influences on Project Team Performance

Horii, T.; Jin, Y.; Levitt, R. E. - In: Computational and mathematical organization theory 10 (2005) 4, pp. 305-321

Persistent link: https://www.econbiz.de/10006077841

SEMICONDUCTOR -- TECHNOLOGY AND RELIABILITY - Interaction of Interface-Traps Located at Various Sites in MOSFETs Under Stress

Chen, G.; Li, M.F.; Jin, Y. - In: IEEE transactions on reliability : R ; IEEE T R 51 (2002) 4, pp. 387-391

Persistent link: https://www.econbiz.de/10006615347

SPECIAL SECTION -- FAULT-TOLERANT VLSI SYSTEMS - PAPERS - Fault-Tolerant VLSI Systems - Fault-Tolerant Evolvable Hardware Using Field-Programmable Transistor Arrays

Keymeulen, D.; Zebulum, R.S.; Jin, Y.; Stoica, A. - In: IEEE transactions on reliability : R ; IEEE T R 49 (2000) 3, pp. 305-316

Persistent link: https://www.econbiz.de/10006621846

Application of genetic algorithm for reliability allocation in nuclear power plants

Yang, J.-E.; Hwang, M.-J.; Sung, T.-Y.; Jin, Y. - In: Reliability engineering & system safety 65 (1999) 3, pp. 229-238

Persistent link: https://www.econbiz.de/10006842957

Hedging stock market risks : can gold really beat bonds?

Ma, Rufei; Sun, Bianxia; Zhai, Pengxiang; Jin, Yi - In: Finance research letters 42 (2021), pp. 1-7

Persistent link: https://www.econbiz.de/10014580454

DAKA: design activity knowledge acquisition through data-mining

Jin, Y.; Ishino, Y. - In: International journal of production research : American … 44 (2006) 14, pp. 2813-2838

Persistent link: https://www.econbiz.de/10007265848

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