Raju, M.; Chaudhary, Sujeet; Pandya, D.K. - In: The European Physical Journal B - Condensed Matter and … 86 (2013) 12, pp. 1-8
The effect of optimum dilution of antiferromagnetic (AF)/ferromagnetic (FM) interface necessary for observance of positive exchange bias in ion-beam sputtered Si/Ir<Subscript>22</Subscript>Mn<Subscript>78</Subscript> (t <Subscript>AF</Subscript> = 12, 18, 24 nm)/Co<Subscript>20</Subscript>Fe<Subscript>60</Subscript>B<Subscript>20</ Subscript>(t <Subscript>FM</Subscript> = 6,9,15 nm) exchange coupled bilayers is investigated by magnetic annealing...</subscript><//></subscript></subscript></subscript></subscript></subscript></subscript>