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PARAMETRIC EMPIRICAL BAYES CONFIDENCE INTERVALS BASED ON JAMES-STEIN ESTIMATOR
Kun, He
- In:
Statistics & Risk Modeling
10
(
1992
)
1-2
,
pp. 121-132
Persistent link: https://www.econbiz.de/10010742581
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52
ESTIMATION IN SPHERICALLY SYMMETRIC REGRESSION WITH RANDOM DESIGN
Kun, He
;
Strawderman William E.
- In:
Statistics & Risk Modeling
19
(
2001
)
1
,
pp. 41-50
Persistent link: https://www.econbiz.de/10010742776
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