A comparison of statistical regression and neural network methods in modeling measurement errors for computer vision inspection systems
Year of publication: |
1995
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Authors: | Chang, C.Alec ; Su, Chao-Ton |
Published in: |
Computers & industrial engineering : CAIE ; an internat. journal. - Amsterdam [u.a.] : Elsevier, ISSN 0360-8352, ZDB-ID 1969936. - Vol. 28.1995, 3, p. 593-604
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