A coordinate SPC model for assuring designated fit quality via quality-oriented statistical tolerancing
Year of publication: |
2009
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Authors: | Zhang, Yu ; Yang, Musheng |
Published in: |
Computers & industrial engineering : CAIE ; an internat. journal. - Amsterdam [u.a.] : Elsevier, ISSN 0360-8352, ZDB-ID 1969936. - Vol. 57.2009, 1, p. 73-79
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