A Failure-Censored Life Test Procedure for Exponential Distribution
Year of publication: |
1993
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Authors: | Seo, S.K. ; Yum, B.J. |
Published in: |
Reliability engineering & system safety. - London : Elsevier, ISSN 0951-8320, ZDB-ID 612029. - Vol. 41.1993, 3, p. 245-250
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