A methodology of pattern recognition schemes for two variables in SPC
Year of publication: |
1995
|
---|---|
Authors: | Chih, Wen‐Hai ; Rollier, Dwayne A. |
Published in: |
International Journal of Quality & Reliability Management. - MCB UP Ltd, ISSN 1758-6682, ZDB-ID 1466792-7. - Vol. 12.1995, 3, p. 86-107
|
Publisher: |
MCB UP Ltd |
Subject: | Expert systems | Knowledge‐based systems | Mathematics | Methodology | Personal computers | Quality | Recognition | Statistical process control |
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