A multi-attribute measure for innovation adoption: The context of imaging technology
Year of publication: |
1999
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Authors: | Wilson, A.L. ; Ramamurthy, K. ; Nystrom, P.C. |
Published in: |
IEEE transactions on engineering management : EM. - New York, NY : IEEE, ISSN 0018-9391, ZDB-ID 1604387. - Vol. 46.1999, 3, p. 311-321
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