A multivariate parameter trace analysis for online fault detection in a semiconductor etch tool
Year of publication: |
2012
|
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Authors: | Ko, Jong Myoung ; Kim, Chang Ouk |
Published in: |
International journal of production research. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 160477-6. - Vol. 50.2012, 23 (1.12.), p. 6639-6654
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Subject: | dynamic time warping | Kalman filtering | multivariate analysis | recursive T 2 update | semiconductor manufacturing tool | tool fault detection | tool parameter traces. | Multivariate Analyse | Multivariate analysis | Halbleiterindustrie | Semiconductor industry | Zeitreihenanalyse | Time series analysis | Halbleiter | Semiconductor | Zustandsraummodell | State space model |
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