A New Criterion for Confounder Selection
Year of publication: |
2011
|
---|---|
Authors: | VanderWeele, Tyler J. ; Shpitser, Ilya |
Published in: |
Biometrics. - The International Biometric Society. - Vol. 67.2011, 4, p. 1406-1413
|
Publisher: |
The International Biometric Society |
Saved in:
Online Resource
Saved in favorites
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