A new lot sentencing approach by variables inspection based on process yield
Chien-Wei Wu and Shih-Wen Liu
| Year of publication: |
1-15 June 2018
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|---|---|
| Authors: | Wu, Chien-wei ; Liu, Shih-Wen |
| Published in: |
International journal of production research. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 160477-6. - Vol. 56.2018, 12 (1/15.6.), p. 4087-4099
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| Subject: | quality management | quality control | acceptable quality level | average sample number | process yield index | Qualitätsmanagement | Quality management | Produktionssteuerung | Production control | Produktqualität | Product quality | USA | United States | Theorie | Theory |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1080/00207543.2018.1424365 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10011901417