A revisit to the relationship between patents and R&D using empirical likelihood estimation
Year of publication: |
2012
|
---|---|
Authors: | Hsueh, Sheng-Pin ; Lee, Wei-Ming |
Published in: |
Economics Bulletin. - AccessEcon, ISSN 1545-2921. - Vol. 32.2012, 2, p. 1208-1214
|
Publisher: |
AccessEcon |
Subject: | patent | R&D | panel count data | empirical likelihood |
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