A study on negative binomial inspection for imperfect production systems
Year of publication: |
2013
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Authors: | Huang, Yeu-Shiang ; Lin, Yan-Jun ; Ho, Jyh-Wen |
Published in: |
Computers & industrial engineering : CAIE ; an internat. journal. - Amsterdam [u.a.] : Elsevier, ISSN 0360-8352, ZDB-ID 1969936. - Vol. 65.2013, 4, p. 605-613
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