An analysis of imperfect RFID visibility in a multi-echelon supply chain
Nebil Buyurgan and Manuel D. Rossetti; Ronald T. Walker
Year of publication: |
2010
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Authors: | Buyurgan, Nebil ; Rossetti, Manuel D. ; Walker, Ronald T. |
Published in: |
International journal of logistics systems and management. - Olney : Inderscience, ISSN 1742-7967, ZDB-ID 21787955. - Vol. 7.2010, 4, p. 431-455
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