An improved description of the dielectric breakdown in oxides based on a generalized Weibull distribution
Year of publication: |
2006
|
---|---|
Authors: | Costa, U.M.S. ; Freire, V.N. ; Malacarne, L.C. ; Mendes, R.S. ; Picoli Jr., S. ; de Vasconcelos, E.A. ; da Silva Jr., E.F. |
Published in: |
Physica A: Statistical Mechanics and its Applications. - Elsevier, ISSN 0378-4371. - Vol. 361.2006, 1, p. 209-215
|
Publisher: |
Elsevier |
Subject: | Weibull distribution | Dielectric breakdown | Reliability | MOS devices |
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