An omnibus lack of fit test in logistic regression with sparse data
Year of publication: |
2012
|
---|---|
Authors: | Liu, Ying ; Nelson, Paul ; Yang, Shie-Shien |
Published in: |
Statistical Methods and Applications. - Springer, ISSN 1618-2510. - Vol. 21.2012, 4, p. 437-452
|
Publisher: |
Springer |
Subject: | Model building | Binary response | Pseudo replicates | Type I error | Power |
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