Applicant and examiner citations in U.S. patents: An overview and analysis
Year of publication: |
2009
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Authors: | Alcácer, Juan ; Gittelman, Michelle ; Sampat, Bhaven |
Published in: |
Research policy : policy and management studies of science, technology and innovation. - Amsterdam [u.a.] : Elsevier, ISSN 0048-7333, ZDB-ID 1211493. - Vol. 38.2009, 2, p. 415-428
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