Applicant and examiner citations in US patents : an overview and analysis
Year of publication: |
2009
|
---|---|
Authors: | Alcácer, Juan ; Gittelman, Michelle ; Sampat, Bhaven N. |
Published in: |
Research policy : policy, management and economic studies of science, technology and innovation. - Amsterdam [u.a.] : Elsevier, ISSN 0048-7333, ZDB-ID 121149-3. - Vol. 38.2009, 2, p. 415-427
|
Subject: | Patent | USA | United States |
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