Application of the simulated annealing local search technique to problems of redundancy elimination in functional and parametric tests of integrated circuits
Testing integrated circuits is a costly process. The present article investigates combinatorial optimization problems reducing subsets of tests, which are redundant in a statistical sense. The solution to those problems is brought about by application of the Simulated annealing local search technique, which, in turn makes wide use of random number generation.
Year of publication: |
2003
|
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Authors: | Mergenthaler, W. ; Mauersberg, B. ; Feller, J. ; Stuehler, L.J. ; O’Grady, W.T. ; Ledford, J.S. |
Published in: |
Mathematics and Computers in Simulation (MATCOM). - Elsevier, ISSN 0378-4754. - Vol. 62.2003, 3, p. 443-451
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Publisher: |
Elsevier |
Subject: | Redundancy elimination | Integrated circuits | Test cost reduction | Simulated annealing |
Saved in:
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