Applied risk analysis : moving beyond uncertainty in business
Year of publication: |
2004
|
---|---|
Authors: | Mun, Johnathan |
Publisher: |
Hoboken, N.J. : Wiley |
Subject: | Risikoanalyse |
Description of contents: | Table of Contents [digitool.hbz-nrw.de] |
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Einfache ökonometrische Verfahren für dieKreditrisikomessung: Verweildauermodelle
Kaiser, Ulrich, (2000)
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Grundke, Peter, (2000)
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Grundzüge der Migrationsanalyse zur Ermittlung des Bonitätsrisikos auf Portfolioebene
Börner, Christoph J., (1999)
- More ...
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Mun, Jonathan, (2010)
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The contrarian investment strategy: additional evidence
Mun, Johnathan, (2001)
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Why do some merger and acquisitions deals fail? A global perspective
Attah‐Boakye, Rexford, (2020)
- More ...