Asymptotic equivalence and sufficiency for volatility estimation under microstructure noise
Year of publication: |
2011
|
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Authors: | Reiß, Markus |
Publisher: |
Berlin : Humboldt University of Berlin, Collaborative Research Center 649 - Economic Risk |
Subject: | Finanzmarkt | Volatilität | Zeitreihenanalyse | Nichtparametrisches Verfahren | Schätztheorie | Mikrostrukturanalyse | Noise Trading | Theorie | high-frequency data | integrated volatility | spot volatility estimation | Le Cam deficiency | equivalence of experiments | Gaussian shift |
Series: | SFB 649 Discussion Paper ; 2011-028 |
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Type of publication: | Book / Working Paper |
Type of publication (narrower categories): | Working Paper |
Language: | English |
Other identifiers: | 661170500 [GVK] hdl:10419/56705 [Handle] RePEc:zbw:sfb649:sfb649dp2011-028 [RePEc] |
Classification: | C14 - Semiparametric and Nonparametric Methods ; c58 |
Source: |
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