Availability of systems with self-diagnostic components-applying Markov model to IEC 61508-6
Year of publication: |
2003
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Authors: | Zhang, Tieling ; Long, Wei ; Sato, Yoshinobu |
Published in: |
Reliability engineering & system safety. - London : Elsevier, ISSN 0951-8320, ZDB-ID 612029. - Vol. 80.2003, 2, p. 133-142
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