Bayesian inspection model with the negative binomial prior in the presence of inspection errors
Year of publication: |
2007
|
---|---|
Authors: | Chun, Young H. ; Sumichrast, Robert T. |
Published in: |
European Journal of Operational Research. - Elsevier, ISSN 0377-2217. - Vol. 182.2007, 3, p. 1188-1202
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Publisher: |
Elsevier |
Saved in:
Online Resource
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