Characterization of nanostructured material images using fractal descriptors
Year of publication: |
2013
|
---|---|
Authors: | Florindo, João B. ; Sikora, Mariana S. ; Pereira, Ernesto C. ; Bruno, Odemir M. |
Published in: |
Physica A: Statistical Mechanics and its Applications. - Elsevier, ISSN 0378-4371. - Vol. 392.2013, 7, p. 1694-1701
|
Publisher: |
Elsevier |
Subject: | FEG images | Nanoscale materials | Pattern recognition | Fractal dimension | Fractal descriptors | Image analysis |
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