COMMENTARY & PERSPECTIVE - A critique of the Reliability-Analysis-Center failure-rate-model for plastic encapsulated microciruits
Year of publication: |
1998
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Authors: | Sinnadurai, N. ; Shukla, A. ; Pecht, M. |
Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 47.1998, 2, p. 110-113
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