Comparing cumulative incidence functions of a competing-risks model
Year of publication: |
1997
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Authors: | Sun, Y. ; Tiwari, R. |
Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 46.1997, 2, p. 247-252
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