Cultural heritage materials : an XPS approach
Claudia Altavilla and Enrico Ciliberto
| Year of publication: |
2011
|
|---|---|
| Authors: | Altavilla, Claudia ; Ciliberto, Enrico |
| Publisher: |
Hauppauge, NY : Nova Science |
| Subject: | Kulturelles Eigentum | Schutz | Künstler | Röntgen | Cultural property--Protection. | Artists' materials--Analysis. | X-ray photoelectron spectroscopy. |
| Description of contents: | Table of Contents [digitool.hbz-nrw.de] |
| Extent: | 66 S. : Ill., graph. Darst. 23 cm |
|---|---|
| Series: | |
| Type of publication: | Book / Working Paper |
| Language: | English |
| ISBN: | 978-1-61324-651-1 ; 1-613-24651-X |
| Classification: | Ethnopsychologie |
| Source: |
Persistent link: https://www.econbiz.de/10009497668