Cycle time estimation for semiconductor final testing processes with Weibull-distributed waiting time
Year of publication: |
2012
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Authors: | Tai, Y.T. ; Pearn, W.L. ; Lee, J.H. |
Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 50.2012, 2 (15.1.), p. 581-593
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