Degradation - Residual Life Predictions in the Absence of Prior Degradation Knowledge
Year of publication: |
2009
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Authors: | Gebraeel, N. ; Elwany, A. ; Pan, J. |
Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 58.2009, 1, p. 106-117
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