Determining the optimal probing lot size for the wafer probe operation in semiconductor manufacturing
Year of publication: |
2009
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Authors: | Wang, Chih-hsiung |
Published in: |
European journal of operational research : EJOR. - Amsterdam : Elsevier, ISSN 0377-2217, ZDB-ID 243003-4. - Vol. 197.2009, 1 (16.8.), p. 126-133
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Subject: | Losgröße | Lot size | Produktionssteuerung | Production control | Halbleiterindustrie | Semiconductor industry | Halbleiter | Semiconductor | Mathematische Optimierung | Mathematical programming | USA | United States |
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