Discussion - More Pitfalls of Accelerated Tests
Year of publication: |
2013
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Authors: | Pan, Rong |
Published in: |
Journal of quality technology : a quarterly journal of methods, applications and related topics. - Milwaukee, Wis. : ASQ, ISSN 0022-4065, ZDB-ID 4105126. - Vol. 45.2013, 3, p. 233-235
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