Discussion - More Pitfalls of Accelerated Tests
| Year of publication: |
2013
|
|---|---|
| Authors: | Vander Wiel, Scott ; Weaver, Brian P ; Stepan, Thomas |
| Published in: |
Journal of quality technology : a quarterly journal of methods, applications and related topics. - Milwaukee, Wis. : ASQ, ISSN 0022-4065, ZDB-ID 4105126. - Vol. 45.2013, 3, p. 238-239
|