Does Standard Deviation Matter? Using “Standard Deviation” to Quantify Security of Multistage Testing
Year of publication: |
2014
|
---|---|
Authors: | Wang, Chun ; Zheng, Yi ; Chang, Hua-Hua |
Published in: |
Psychometrika. - Springer. - Vol. 79.2014, 1, p. 154-174
|
Publisher: |
Springer |
Subject: | computerized adaptive testing | multistage testing | item exposure | test overlap rate | standard deviation |
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